Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
As the complexity of modern digital systems increases, so does the need for ever more rigorous testing at all levels, from individual chips up to complete system architectures. This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing. It covers every key topic, including fault simulation, CMOS testing, design for testability, and built-in self test. The book is aimed at graduate students of electrical and computer engineering, and is the most up-to-date reference volume on the market for practicing engineers.
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* Hardcover: 1016 pages
* Publisher: Cambridge University Press; 1 edition (May 15, 2003)
* Language: English
* ISBN-10: 0521773563
* ISBN-13: 978-0521773560
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